The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Apr. 28, 2011
Uwe Luecken, Eindhoven, NL;
Alan Frank DE Jong, Eindhoven, NL;
Gerrit Cornelis Van Hoften, Veldhoven, NL;
Frank Jeroen Pieter Schuurmans, Valkenswaard, NL;
Uwe Luecken, Eindhoven, NL;
Alan Frank de Jong, Eindhoven, NL;
Gerrit Cornelis van Hoften, Veldhoven, NL;
Frank Jeroen Pieter Schuurmans, Valkenswaard, NL;
FEI Company, Hillsboro, OR (US);
Abstract
A method of using a direct electron detector in a TEM, in which an image with a high intensity peak, such as a diffractogram or an EELS spectrum, is imaged on said detector. As known the high intensity peak may damage the detector. To avoid this damage, the center of the image is moved, as a result of which not one position of the detector is exposed to the high intensity, but the high intensity is smeared over the detector, displacing the high intensity peak before damage results.