The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Apr. 19, 2012
Applicants:

Charles J. Alpert, Austin, TX (US);

Zhuo LI, Cedar Park, TX (US);

Natarajan Viswanathan, Austin, TX (US);

Samuel I. Ward, Austin, TX (US);

Inventors:

Charles J. Alpert, Austin, TX (US);

Zhuo Li, Cedar Park, TX (US);

Natarajan Viswanathan, Austin, TX (US);

Samuel I. Ward, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Datapath placement defines tiers for placement sets of a cell cluster, assigns cells to the tiers constrained by the datapath width, and then orders cells within each tier. Clusters are identified using machine-learning based datapath extraction. Datapath width is determined by computing a size of a bounding box for cells in the cluster. Placement sets are identified using a breadth-first search beginning with input cells for the cluster. Tiers are initially defined using logic depth assignment. A cell may be assigned to a tier by pulling the cell from the next higher tier to fill an empty location or by pushing an excess cell into the next higher tier. Cells are ordered within each tier using greedy cell assignment according to a wirelength cost function. The datapath placement can be part of an iterative process which applies spreading constraints to the cluster based on computed congestion information.


Find Patent Forward Citations

Loading…