The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
May. 28, 2010
Erich F. Haratsch, Bethlehem, PA (US);
Shaohua Yang, San Jose, CA (US);
Nenad Miladinovic, Campbell, CA (US);
Yuan Xing Lee, San Jose, CA (US);
Erich F. Haratsch, Bethlehem, PA (US);
Shaohua Yang, San Jose, CA (US);
Nenad Miladinovic, Campbell, CA (US);
Yuan Xing Lee, San Jose, CA (US);
LSI Corporation, San Jose, CA (US);
Abstract
Methods and apparatus are provided for detection of a synchronization mark based on a position of an extreme distance metric. A synchronization mark is detected in a received signal by computing a distance metric between the received signal and an ideal version of the received signal expected when reading the synchronization mark, wherein the distance metric is computed for a plurality of positions within a search window; determining a substantially extreme distance metric within the search window; and detecting the synchronization mark based on a position of the substantially extreme distance metric. The distance metric can comprise a sum of square differences or a Euclidean distance between the received signal and the ideal version of the received signal.