The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Dec. 21, 2011
David William Sesko, Woodinville, WA (US);
David William Sesko, Woodinville, WA (US);
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A method of error compensation in a chromatic point sensor (CPS) reduces errors associated with varying workpiece spectral reflectivity. The errors are associated with a distance-independent profile component of the CPS measurement signals. Workpiece spectral reflectivity may be characterized using known spectral reflectivity for a workpiece material, or by measuring the workpiece spectral reflectivity using the CPS system. CPS spectral reflectivity measurement may comprise scanning the CPS optical pen to a plurality of distances relative to a workpiece surface and determining a distance-independent composite spectral profile from a plurality of resulting wavelength peaks. By comparing the distance-independent composite spectral profile obtained from a workpiece with that corresponding to the CPS distance calibration procedure, the contribution of the reflectivity characteristics of the workpiece will be indicated in the differences between the profiles, and potential CPS position errors due to varying workpiece reflectivity characteristics may be calculated and/or compensated.