The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Feb. 15, 2011
Applicants:
Felix Albu, Bucharest, RO;
Larry Murray, Galway, IE;
Piotr Stec, Galway, IE;
Ilariu Raducan, Galway, IE;
Inventors:
Felix Albu, Bucharest, RO;
Larry Murray, Galway, IE;
Piotr Stec, Galway, IE;
Ilariu Raducan, Galway, IE;
Assignee:
DigitalOptics Corporation Europe Limited, Galway, IE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 7/18 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/00 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measure of frame-to-frame rotation is determined. A global XY alignment of a pair of frames is performed. Local XY alignments in at least two matching corner regions of the pair of images are determined after the global XY alignment. Based on differences between the local XY alignments, a global rotation is determined between the pair of frames.