The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Dec. 23, 2010
Applicants:

Sajosh Janarthanam, Austin, TX (US);

Jonathan Owen, Northborough, MA (US);

Michael Osborn, Hollis, NH (US);

Inventors:

Sajosh Janarthanam, Austin, TX (US);

Jonathan Owen, Northborough, MA (US);

Michael Osborn, Hollis, NH (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first in, first out (FIFO) queue includes logic to provide detection of operational errors in the FIFO queue. The FIFO queue includes entries to store data written to the FIFO queue and signature bits, each signature bit corresponding to one of the entries. A test pattern and a read signature register includes a number of bits greater than a depth of the FIFO queue. A comparator compares the test pattern to the read signature register and output an error signal indicating whether the test pattern matches the read signature register.


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