The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Jan. 07, 2011
Sundeep Vaddadi, San Diego, CA (US);
John H. Hong, San Diego, CA (US);
Onur C. Hamsici, La Jolla, CA (US);
Chong U. Lee, San Diego, CA (US);
Sundeep Vaddadi, San Diego, CA (US);
John H. Hong, San Diego, CA (US);
Onur C. Hamsici, La Jolla, CA (US);
Chong U. Lee, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A normalization process is implemented at a difference of scale space to completely or substantially reduce the effect that illumination changes has on feature/keypoint detection in an image. An image may be processed by progressively blurring the image using a smoothening function to generate a smoothened scale space for the image. A difference of scale space may be generated by taking the difference between two different smoothened versions of the image. A normalized difference of scale space image may be generated by dividing the difference of scale space image by a third smoothened version of the image, where the third smoothened version of the image that is as smooth or smoother than the smoothest of the two different smoothened versions of the image. The normalized difference of scale space image may then be used to detect one or more features/keypoints for the image.