The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8581571 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 12, 2013

Filed:

Feb. 11, 2010
Applicants:

Taro Osumi, Gunma, JP;

Yutaka Ueki, Saitama, JP;

Inventors:

Taro Osumi, Gunma, JP;

Yutaka Ueki, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/165 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measurement apparatus that measures a characteristic of a filter, comprising a first transmission line that has the filter connected therein, the first transmission line receiving a multi-tone signal having signal components at a plurality of frequencies from an input end thereof, passing the multi-tone signal through the filter, and outputting the multi-tone signal from an output end thereof; a second transmission line that receives the multi-tone signal from an input end thereof, propagates the multi-tone signal therein, and outputs the multi-tone signal from an output end thereof; and a measuring section that calculates the characteristic of the filter based on the multi-tone signal output from the output end of the first transmission line and the multi-tone signal output from the output end of the second transmission line.


Find Patent Forward Citations

Osumi, Taro. (2013). Measuring apparatus, testing apparatus and measuring method (U.S. Patent No. 8581571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8581571

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