The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Apr. 24, 2008
Zongwu Tang, Pleasanton, CA (US);
Daniel Zhang, San Jose, CA (US);
Alex Miloslavsky, Sunnyvale, CA (US);
Subarnarekha Sinha, Menlo Park, CA (US);
Jingyu Xu, Beijing, CN;
Kent Y. Kwang, Saratoga, CA (US);
Kevin A. Beaudette, Orleans, CA (US);
Zongwu Tang, Pleasanton, CA (US);
Daniel Zhang, San Jose, CA (US);
Alex Miloslavsky, Sunnyvale, CA (US);
Subarnarekha Sinha, Menlo Park, CA (US);
Jingyu Xu, Beijing, CN;
Kent Y. Kwang, Saratoga, CA (US);
Kevin A. Beaudette, Orleans, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
One embodiment of the present invention provides a system that generates a pattern-clip-based hotspot database for performing automatic pattern-clip-based layout verification. During operation, the system receives a list of pattern clips which specify manufacturing hotspots to be avoided in a layout, wherein each pattern clip comprises a set of geometries in proximity to each other. Next, for each pattern clip, the system perturbs the pattern clip to determine a first range of variations for the constituent set of geometries wherein the perturbed pattern clip no longer causes a manufacturing hotspot. The system then extracts a set of correction guidance descriptions from the first range of variations for correcting the pattern clip. Subsequently, the system stores the pattern clip and the set of correction guidance descriptions in the pattern-clip-based hotspot database.