The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Nov. 23, 2011
John G. Ferguson, Tualatin, OR (US);
Bikram Garg, Noida, IN;
John G. Ferguson, Tualatin, OR (US);
Bikram Garg, Noida, IN;
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Waiver regions may be identified by waiver identification items. The waiver identification items may be determined based on conducting a density check process. Additionally or alternatively, reference patterns for pattern matching, cell names or markers may serve as the waiver identification items. Waiver geometric items may be created for the waiver regions and added to the layout design. Based on an overlap of a density check window with the waiver geometric items and waiving threshold information, a density violation in that density check window is determined to be reported as a density violation or a waived density violation with some implementations of the invention. With some other implementations of the invention, pattern density of a density check window may not be checked if an overlap of the density check window with the waiver geometric items is above a waiving threshold value.