The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Aug. 31, 2011
Hiroshi Takeda, Tokyo, JP;
Ken-ichi Nishimori, Tokyo, JP;
Tomotaka Yokoyama, Tokyo, JP;
Tadashi Tomonaga, Tokyo, JP;
Hiroshi Takeda, Tokyo, JP;
Ken-ichi Nishimori, Tokyo, JP;
Tomotaka Yokoyama, Tokyo, JP;
Tadashi Tomonaga, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Hoya Glass Disk (thailand) Ltd., Lamphun, TH;
Abstract
A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile