The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Sep. 21, 2011
Applicants:

Fumihiro Takemura, Kawasaki, JP;

Kozo Ariga, Tokyo, JP;

Inventors:

Fumihiro Takemura, Kawasaki, JP;

Kozo Ariga, Tokyo, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/48 (2006.01); G06F 3/048 (2013.01); G01N 3/42 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G01N 3/42 (2013.01); G06F 9/4443 (2013.01);
Abstract

A hardness tester includes a monitor capable of displaying a main screen and assistant screen. A first test location setter sets a coordinate point of an indentation formation location, and stores a setting condition of the set coordinate point and the surface image of a first test specimen. A second test location setter displays the surface image of the first test specimen in the assistant screen when a surface image of a second test specimen is displayed on the main screen, and, when a reference coordinate is set on the surface image of the second test specimen, determines a coordinate point of an indentation formation location based on the set reference coordinate and the setting condition of the coordinate point stored by the first test location setter.


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