The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Aug. 24, 2011
Ramesh C. Tekumalla, Breinigsville, PA (US);
Priyesh Kumar, Pune, IN;
Prakash Krishnamoorthy, Bethlehem, PA (US);
Parag Madhani, Allentown, PA (US);
Ramesh C. Tekumalla, Breinigsville, PA (US);
Priyesh Kumar, Pune, IN;
Prakash Krishnamoorthy, Bethlehem, PA (US);
Parag Madhani, Allentown, PA (US);
LSI Corporation, San Jose, CA (US);
Abstract
An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises at least one scan chain having a plurality of scan cells, with the scan chain being configured to operate as a serial shift register in a scan shift mode of operation and to capture functional data from at least a portion of the additional circuitry in a functional mode of operation. At least a given one of the scan cells of the scan chain comprises output control circuitry which is configured to disable a functional data output of the scan cell in the scan shift mode of operation and to disable a scan output of the scan cell in the functional mode of operation.