The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Sep. 07, 2007
Applicants:

Oleg Logvinov, East Brunswick, NJ (US);

Lawrence F. Durfee, Washington, NJ (US);

Richard Walvis, Santa Cruz, CA (US);

Michael J. Macaluso, Jackson, NJ (US);

Inventors:

Oleg Logvinov, East Brunswick, NJ (US);

Lawrence F. Durfee, Washington, NJ (US);

Richard Walvis, Santa Cruz, CA (US);

Michael J. Macaluso, Jackson, NJ (US);

Assignee:

STMicroelectronics, Inc., Coppell, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention presents a novel method to channel estimation in OFDM systems. The embodiment of this invention is a block of new logic and modifications performed to other components of the system, added to any existing OFDM receiver, which utilizes information available from other blocks as found in the receiver. This logic would improve the units' error rate because of the improved channel quality estimations it makes available. This improvement is made possible because both channel noise data and channel signal data are used in the estimation process. This data goes through a learning process over time and multiple data blocks for further improvements in the quality of the estimate. This improvement is possible without any direct communications with other remote units, but it could be used in a multi-node environment to improve the performance of the system as the whole.


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