The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Apr. 04, 2009
Reiner Mitzkus, Goettingen, DE;
Eugen Wehner, Goettingen, DE;
Stefan Steinborn, Bovenden, DE;
Gleb Milinovici, Goettingen, DE;
Steffen Leidenbach, Reinhausen, DE;
Peter Westphal, Jena, DE;
Reiner Mitzkus, Goettingen, DE;
Eugen Wehner, Goettingen, DE;
Stefan Steinborn, Bovenden, DE;
Gleb Milinovici, Goettingen, DE;
Steffen Leidenbach, Reinhausen, DE;
Peter Westphal, Jena, DE;
Carl Zeiss Microimaging GmbH, Jena, DE;
Abstract
The invention relates to a microscope having a stage for supporting a sample to be examined, a recording sensor, an imaging optic for imaging the sample onto the recording sensor, a moving unit by means of which the distance between the stage and the imaging optic can be changed, a control unit for controlling an image recording of the sample and a focus-holding unit for maintaining a prescribed focal position for image recording of the sample at temporal intervals, wherein the focus-holding device comprises at least one hardware element and one software module, wherein the focus-holding unit is fully integrated in the control unit, on both the hardware and software sides.