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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8560905 B1

PDFFull Text
Date of Patent:
Oct. 15, 2013

Filed:

Jan. 05, 2012

Programmable test compression architecture with serial input register and multiplexer

Applicant:

Lee D. Whetsel, Parker, TX (US);

Inventor:

Lee D. Whetsel, Parker, TX (US);

Assignee:

Texas Instruments Incororated, Dallas, TX (US);

Attorneys:

Lawrence J. Bassuk

Wade J. Brady, III

Frederick J. Telecky, Jr.

Primary Examiner:

Cynthia Britt

Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.

Find Patent Forward Citations

Whetsel, Lee. (2013). Programmable test compression architecture with serial input register and multiplexer (U.S. Patent No. 8560905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8560905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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