The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Sep. 03, 2010
Applicant:
Yoshihiro Hashimoto, Saitama, JP;
Inventor:
Yoshihiro Hashimoto, Saitama, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test apparatus that measures a peak in a current supplied to a device under test via a transmission path which transmits power from a power supply to a device under test, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential, and judges acceptability of the device under test based on the peak measured by the current measuring section.