The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

Dec. 13, 2010
Applicants:

Peter Rabkin, Cupertino, CA (US);

Andrei Mihnea, San Jose, CA (US);

Inventors:

Peter Rabkin, Cupertino, CA (US);

Andrei Mihnea, San Jose, CA (US);

Assignee:

SanDisk 3D LLC, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/329 (2006.01); H01L 21/33 (2006.01); H01L 27/02 (2006.01); H01L 23/60 (2006.01); H01L 23/62 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0255 (2013.01);
Abstract

A punch-through diode and method of fabricating the same are disclosed herein. The punch-through diode may be used as a steering element in a memory device having a reversible resistivity-switching element. For example, a memory cell may include a reversible resistivity-switching element in series with a punch-through diode. The punch-through diode allows bipolar operation of a cross-point memory array. The punch-through diode may have a symmetrical non-linear current/voltage relationship. The punch-through diode has a high current at high bias for selected cells and a low leakage current at low bias for unselected cells. In other words, the ratio of Ion/Ioff is high. Therefore, the punch-through diode is compatible with bipolar switching in cross-point memory arrays having resistive switching elements.


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