The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Aug. 06, 2008
Joerg Pacholik, Kunitz, DE;
Marco Hanft, Jena, DE;
Dieter Huhse, Berlin, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a laser scanning microscope with a scanner and a microscope objective, and to a control method for such a microscope. In order to obtain sharp imaging of the sample in a laser scanning microscope, the distance between the microscope objective and the sample is usually varied for adjusting the focus position. However, relative movements between the objective and the sample can be problematic. In view of the costly special objective, internal focusing of the objective is a disadvantageous solution. An improved laser scanning microscope should make it possible to sharply image a sample with standard objectives without relative movement between the microscope objective and sample. According to the invention, a tube lens is provided which is displaceable along the optical axis, and the focus position is adjustable relative to a front optical element of the microscope objective by adjusting the tube lens.