The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

May. 06, 2010
Applicants:

Revanta Banerji, Beacon, NY (US);

Soroush Abbaspour, Ossining, NY (US);

Peter Feldmann, New York, NY (US);

Hemlata Gupta, Hopewell Jct., NY (US);

Inventors:

Revanta Banerji, Beacon, NY (US);

Soroush Abbaspour, Ossining, NY (US);

Peter Feldmann, New York, NY (US);

Hemlata Gupta, Hopewell Jct., NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for accurately performing a timing, power, and noise analysis by pre-processing the characterization points of the available libraries, storing time consuming parts of the analysis and utilizing the pre-processed information during active runs to calculate the attributes at a desired PVT point. The PVT space is preferably sub-divided into triangular or rectangular regions, preferably obtained using Delaunay triangulation. In one embodiment, the invention performs an up-front pre-processing step on the characterized libraries to compute the static portion of the interpolation function that is independent of the specific instance; and a coefficient matrix that allows for interpolation of specific instances.


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