The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Mar. 19, 2010
Chen-yong Cher, Port Chester, NY (US);
Paul W. Coteus, Yorktown Heights, NY (US);
Alan Gara, Mount Kisco, NY (US);
Eren Kursun, Ossining, NY (US);
David P. Paulsen, Dodge Center, MN (US);
Brian A. Schuelke, Rochester, MN (US);
John E. Sheets, Ii, Zumbrota, MN (US);
Shurong Tian, Mount Kisco, NY (US);
Chen-Yong Cher, Port Chester, NY (US);
Paul W. Coteus, Yorktown Heights, NY (US);
Alan Gara, Mount Kisco, NY (US);
Eren Kursun, Ossining, NY (US);
David P. Paulsen, Dodge Center, MN (US);
Brian A. Schuelke, Rochester, MN (US);
John E. Sheets, II, Zumbrota, MN (US);
Shurong Tian, Mount Kisco, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.