The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Sep. 16, 2008
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention is directed to an optical arrangement for photomanipulation of a sample comprising a sample holder for receiving the sample, an illumination device comprising an illumination light source and an illumination beam path for illuminating the sample with a light sheet. It further comprises a detection device for detecting light that is radiated from the sample and imaging optics which image the sample on the detection device by means of an imaging objective in an imaging beam path, wherein the light sheet is substantially planar in the focus of the imaging objective, and wherein the imaging objective has an optical axis which intersects the plane of the light sheet at an angle different from zero. Further, the arrangement also has means for photomanipulation of the sample.