The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Apr. 02, 2010
Dmitry Budker, El Cerrito, CA (US);
Alexander Pines, Berkeley, CA (US);
Shoujun Xu, Houston, TX (US);
Christian Hilty, College Station, TX (US);
Micah P. Ledbetter, Oakland, CA (US);
Louis S. Bouchard, Los Angeles, CA (US);
Dmitry Budker, El Cerrito, CA (US);
Alexander Pines, Berkeley, CA (US);
Shoujun Xu, Houston, TX (US);
Christian Hilty, College Station, TX (US);
Micah P. Ledbetter, Oakland, CA (US);
Louis S. Bouchard, Los Angeles, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A method and apparatus are described wherein a micro sample of a fluidic material may be assayed without sample contamination using NMR techniques, in combination with magnetoresistive sensors. The fluidic material to be assayed is first subject to pre-polarization, in one embodiment, by passage through a magnetic field. The magnetization of the fluidic material is then subject to an encoding process, in one embodiment an rf-induced inversion by passage through an adiabatic fast-passage module. Thereafter, the changes in magnetization are detected by a pair of solid-state magnetoresistive sensors arranged in gradiometer mode. Miniaturization is afforded by the close spacing of the various modules.