The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
May. 23, 2012
Kirill Buryak, Sunnyvale, CA (US);
Jun Peng, San Ramon, CA (US);
Glenn M. Lewis, Costa Mesa, CA (US);
Nadav Benbarak, Boston, MA (US);
Aner Ben-artzi, Los Angeles, CA (US);
Kirill Buryak, Sunnyvale, CA (US);
Jun Peng, San Ramon, CA (US);
Glenn M. Lewis, Costa Mesa, CA (US);
Nadav Benbarak, Boston, MA (US);
Aner Ben-Artzi, Los Angeles, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
Among other disclosed subject matter, a computer-implemented method that includes receiving a set of clusters of documents and calculating a similarity score for each cluster wherein the similarity score is based at least in part on features included in the documents in the cluster and indicates a measure of similarity of the documents in the cluster. For each cluster associated with a respective similarity score greater than a first threshold, identifying the cluster as satisfying a quality assurance requirement. For each cluster associated with a respective similarity score less than a second threshold, identifying the cluster as failing the quality assurance requirement. For each cluster associated with a similarity score less than or equal to the first threshold value and greater than or equal to the second threshold value, reviewing at least a subset of documents in the cluster to determine whether the cluster satisfies the quality assurance requirement.