The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8539388 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 17, 2013

Filed:

Aug. 09, 2010
Applicants:

Chewn-pu Jou, Hsinchu, TW;

Ming-tsun Lin, Taichung, TW;

Fu-lung Hsueh, Cranbury, NJ (US);

Shauh-teh Juang, Jhubei, TW;

Inventors:

Chewn-Pu Jou, Hsinchu, TW;

Ming-Tsun Lin, Taichung, TW;

Fu-Lung Hsueh, Cranbury, NJ (US);

Shauh-Teh Juang, Jhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A layout system is described comprising a layout unit configured to layout cells in a mask design for a semiconductor chip based on library cells for a specified process node; a non-critical path determination unit configured to determine a non-critical path in the semiconductor chip; a cell determination unit configured to determine a group of cells in the mask design that form a part of the non-critical path and determine the corresponding library cell for at least one of the group of cells; a library cell modifying unit configured to modify one or more corresponding library cells to form a corresponding modified library cell; and a cell replacement unit configured to replace a library cell in the group of cells in the mask design that form a part of the non-critical path with the corresponding modified library cell.


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