The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Dec. 30, 2010
Applicants:

Jinn-yeh Chien, Chu Bei, TW;

Hao-jie Zhan, Hsinchu, TW;

Inventors:

Jinn-Yeh Chien, Chu Bei, TW;

Hao-Jie Zhan, Hsinchu, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit (IC), comprises a receiver on an IC substrate. The receiver is configured to receive a stressed input signal. A built in self test (BIST) circuit is provided on the IC substrate for testing the receiver. The BIST circuit comprises an encoder configured for receiving an input signal and identifying whether a first condition is present, in which two or more consecutive input data bits have the same polarity as each other. An output driver circuit provides the stressed input signal corresponding to the two or more consecutive input data bits. The stressed input signal has an amplitude that is larger when the encoder identifies that the first condition is present and smaller when the encoder identifies that two or more consecutive input data bits have different polarity from each other.


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