The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Mar. 30, 2011
Applicants:
Wolfram Buehler, Hermaringen, DE;
Volker Drexel, Koenigsbronn, DE;
Inventors:
Wolfram Buehler, Hermaringen, DE;
Volker Drexel, Koenigsbronn, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 19/06 (2006.01); H01K 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An electron beam source includes a base and a tip fixed to the base and extending from the base. The tip includes a core and a coating applied to the core. The core has a surface that includes a first material. The coating includes a second material which is different from the first material. The second material forms a surface of the tip, and the second coating includes more than 30% by weight of a lanthanide element.
Quick Actions:
Buehler, Wolfram. (2013). Electron beam source and method of manufacturing the same (U.S. Patent No. 8536773). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8536773
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile