The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Jan. 29, 2010
Applicants:

Robert Walker, Boulder, CO (US);

Mahesh A. Iyer, Fremont, CA (US);

Inventors:

Robert Walker, Boulder, CO (US);

Mahesh A. Iyer, Fremont, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Some embodiments provide a system that facilitates the creation of a design in an electronic design automation (EDA) application. During operation, the system determines a processing order for processing a set of cells in the design. In some embodiments, the processing order can be a reverse-levelized processing order. Next, the system may select a cell for performing area recovery according to the processing order. The system may then tentatively perform an area-recovery operation on the selected cell. Next, the system may determine a zone around the selected cell. Next, the system may propagate arrival times within the zone to obtain updated slack values at endpoints of the zone. The system may compute one or more timing metrics at the endpoints. If the updated slack values do not degrade the timing metric(s) at the endpoints, the system may accept the area-recovery operation of the selected cell.


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