The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8527915 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 03, 2013

Filed:

Nov. 01, 2011
Applicants:

Mei-hsuan Lin, Tainan, TW;

Ling-sung Wang, Tainan, TW;

Chih-hsun Lin, Tainan, TW;

Chih-kang Chao, Tainan, TW;

Inventors:

Mei-Hsuan Lin, Tainan, TW;

Ling-Sung Wang, Tainan, TW;

Chih-Hsun Lin, Tainan, TW;

Chih-Kang Chao, Tainan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides a method and system for modifying a doped region design layout during mask preparation to tune device performance. An exemplary method includes receiving an integrated circuit design layout designed to define an integrated circuit, wherein the integrated circuit design layout includes a doped feature layout; identifying an area of the integrated circuit for device performance modification, and modifying a portion of the doped feature layout that corresponds with the identified area of the integrated circuit during a mask preparation process, thereby providing a modified doped feature layout.


Find Patent Forward Citations

Lin, Mei-Hsuan. (2013). Method and system for modifying doped region design layout during mask preparation to tune device performance (U.S. Patent No. 8527915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8527915

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