The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Apr. 27, 2010
Ruifeng Guo, Portland, OR (US);
Wu-tung Cheng, Lake Oswego, OR (US);
Takeo Kobayashi, Beaverton, OR (US);
Kun-han Tsai, Lake Oswego, OR (US);
Ruifeng Guo, Portland, OR (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Takeo Kobayashi, Beaverton, OR (US);
Kun-Han Tsai, Lake Oswego, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Methods of diagnostic test pattern generation for small delay defects are based on identification and activation of long paths passing through diagnosis suspects. The long paths are determined according to some criteria such as path delay values calculated with SDF (Standard Delay Format) timing information and the number of logic gates on a path. In some embodiments of the invention, the long paths are the longest paths passing through a diagnosis suspect and reaching a corresponding failing observation point selected from the failure log, and N longest paths are identified for each of such pairs.