The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Nov. 24, 2010
Eberhard Neuser, Wunstorf, DE;
Alexander Suppes, Garbsen, DE;
Nils Rothe, Hannover, DE;
Michael Hoetter, Gehrden, DE;
Anja Frost, Hannover, DE;
Eberhard Neuser, Wunstorf, DE;
Alexander Suppes, Garbsen, DE;
Nils Rothe, Hannover, DE;
Michael Hoetter, Gehrden, DE;
Anja Frost, Hannover, DE;
GE Sensing & Inspection Technologies GmbH, Huerth, DE;
Abstract
A computed tomography method for determining a volumetric representation of a sample comprises using reconstructed volume data of the sample from x-ray projections of the sample taken by an x-ray system, computing a set of artificial projections of said sample by a forward projection from said reconstructed volume data, and determining, essentially from process data of said reconstruction including said reconstructed volume data and/or said x-ray projections, individual confidence measures for single voxels of said volume data based on calculating, for each of said measured x-ray projections, the difference between the contribution of this measured x-ray projection to the voxel under inspection and the contribution from a corresponding artificial projection to the voxel under inspection.