The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Jun. 10, 2009
Duhane Lam, Vancouver, CA;
Mark William Ellens, Richmond, CA;
Duhane Lam, Vancouver, CA;
Mark William Ellens, Richmond, CA;
Other;
Abstract
The present invention provides a monitoring device for detecting stresses and strains in structural components and a method of using the monitoring device. The monitoring device comprises a base material, one or more attachment points for attaching the monitoring device to a structure to be monitored, a detection zone on the monitoring device, and a means for detecting the presence of stress and strain in the detection zone. The dimensions and material of the monitoring device are chosen such that a predetermined level of strain transmitted to the monitoring device from the structure will result in a known level of stress and strain in the detection zone. Detection of stress and strain in the detection zone can be correlated to a level of stress and strain experienced by the structure at the point of attachment of the monitoring device.