The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Oct. 21, 2010
Applicants:

Tomonori Goto, Sapporo, JP;

Jyota Miyakura, Kawasaki, JP;

Inventors:

Tomonori Goto, Sapporo, JP;

Jyota Miyakura, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A form measuring device includes: a measuring unit configured to detect a height at each position in a reference axis direction of a measured object and measure a cross-sectional form of the measured object; and an arithmetic unit configured to synthesize a plurality of form measurement data, obtained by repeated measurements of the form of the same measured object by the measuring unit, and calculate synthesized form measurement data. In the synthesis of the form measurement data, the arithmetic unit is configured to calculate shift amounts in the reference axis direction and a height direction of the form measurement data with respect to the synthesized form measurement data and align the form measurement data in the reference axis direction and the height direction based on the calculated shift amount.


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