The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Jun. 03, 2010
Ashwin Kumar, Hiriadka, IN;
Ramakrishnan Balasubramanian, Santa Clara, CA (US);
Rohit Kapur, Cupertino, CA (US);
Rajesh Uppuluri, Bangalore, IN;
Jyotirmoy Saikia, Bangalore, IN;
Parthajit Bhattacharya, Bangalore, IN;
Sunil Reddy Tiyyagura, Hyderabad, IN;
Ashwin Kumar, Hiriadka, IN;
Ramakrishnan Balasubramanian, Santa Clara, CA (US);
Rohit Kapur, Cupertino, CA (US);
Rajesh Uppuluri, Bangalore, IN;
Jyotirmoy Saikia, Bangalore, IN;
Parthajit Bhattacharya, Bangalore, IN;
Sunil Reddy Tiyyagura, Hyderabad, IN;
Synopsys, Inc., Mountain View, CA (US);
Abstract
Systems and methods provide acceleration of automatic test pattern generation in a multi-core computing environment via multi-level parameter value optimization for a parameter set with speculative scheduling. The methods described herein use multi-core based parallel runs to parallelize sequential execution, speculative software execution to explore possible parameter sets, and terminate/prune runs when the optimum parameter value is found at a previous level. The present invention evaluates the design prior to the implementation of the compression IP so that it can define the configuration of DFT and ATPG to maximize the results of compression as measured by test data volume and test application time.