The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Nov. 23, 2010
Jinchi Zhang, Quebec, CA;
Jason Habermehl, Quebec, CA;
Jinchi Zhang, Quebec, CA;
Jason Habermehl, Quebec, CA;
Olympus NDT Inc., Waltham, MA (US);
Abstract
Disclosed is an ultrasonic phased array non-destructive inspection system that includes a PA probe, a conventional PA inspection unit and a refraction angle verification unit. The PA inspection unit is employed to emit ultrasonic angle beams into an AWS IIW Block and to receive a set of corresponding echo signals reflected from the calibration block and to provide time-of-flight (TOF) values corresponding to each angle beam. The refraction angle verification unit then provides a true angle for each of the angle beams based on the ultrasonic and geometric characteristics of the block and the measured TOF values. Other calibration blocks such as the DSC and Nayships blocks can also be used for this purpose.