The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Jun. 29, 2012
Applicants:

Daigo Yamashina, Osaka, JP;

Masaki Inoue, Osaka, JP;

Inventors:

Daigo Yamashina, Osaka, JP;

Masaki Inoue, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes a drift diffusion region of a first conductivity type, a body diffusion region of a second conductivity type, a source diffusion region of the first conductivity type, an insulating film buried in a trench formed in an upper portion of the drift diffusion region and spaced apart from the body diffusion region, a drain diffusion region of the first conductivity type formed in an upper portion of the drift diffusion region and adjacent to the insulating film on the opposite side of the insulating film from the source diffusion region, and a gate electrode formed on a portion of the body diffusion region, the drift diffusion region, and a portion of the insulating film. The drift diffusion region includes a substrate inner region, and a surface region containing an impurity of the first conductivity type at a higher concentration than that of the substrate inner region.


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