The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Jul. 21, 2011
Hidehiro Atagi, Hirakata, JP;
Shuichi Yamada, Hirakata, JP;
Masanori Nakano, Yawata, JP;
Eiji Kawata, Tokyo, JP;
Shuichi Akashi, Tokyo, JP;
Hiroyuki Kuroki, Tokyo, JP;
Hidehiro Atagi, Hirakata, JP;
Shuichi Yamada, Hirakata, JP;
Masanori Nakano, Yawata, JP;
Eiji Kawata, Tokyo, JP;
Shuichi Akashi, Tokyo, JP;
Hiroyuki Kuroki, Tokyo, JP;
Otsuka Electronics Co., Ltd., Hirakata-Shi, JP;
Toppan Printing Co., Ltd., Tokyo, JP;
Abstract
An optical measurement apparatus using an optical fiber to measure the characteristic of an object to be measured arranged along the circumference of a circle includes a first pulley, a second pulley which is turnable on its own axis at a second angular velocity while revolving about the first pulley at a first angular velocity, and the optical fiber which is held by the second pulley and projects detection light on the object to be measured and receives reflected light from the object to be measured. The first angular velocity and the second angular velocity are the same in magnitude and opposite in the direction. Occurrence of a twist in the optical fiber is suppressed, and therefore, the optical measurement apparatus is capable of measuring the characteristics of the object to be measured with high accuracy.