The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Aug. 20, 2012
Yuichi Negami, Ayase, JP;
Akihide Egawa, Ebina, JP;
Hiroyuki Tsuda, Ebina, JP;
Tsuyoshi Sato, Atsugi, JP;
Takuma Goto, Atsugi, JP;
Yuichi Negami, Ayase, JP;
Akihide Egawa, Ebina, JP;
Hiroyuki Tsuda, Ebina, JP;
Tsuyoshi Sato, Atsugi, JP;
Takuma Goto, Atsugi, JP;
Anritsu Corporation, Atsugi-shi, JP;
Abstract
A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.