The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2013

Filed:

May. 05, 2010
Applicant:

Michelle Mary Milvich, Seattle, WA (US);

Inventor:

Michelle Mary Milvich, Seattle, WA (US);

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An encoder configuration comprises an illumination portion, a scale comprising a scale track, and a signal processing electronics. The signal processing electronics may include a detector comprising a first set of three detector sub-portions that provide a first set of signals comprising three respective sub-portion signal subsets that have nominally the same signal characteristics when the scale track is not contaminated or defective. The processing electronics analyze the first set of signals and identify a least-similar sub-portion signal subset that has a corresponding signal characteristic value that is least similar to comparable signal characteristic values associated with more-similar sub-portion signal subsets of the first set of signals. Position measurements are based on valid signals including a plurality of the more-similar sub-portion signal subsets and not including the least-similar sub-portion signal subset if it is significantly different. Accurate measurement may be provided despite significant scale contamination or defects.


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