The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Dec. 27, 2010
Daniel John Kapner, Seattle, WA (US);
Daniel John Kapner, Seattle, WA (US);
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A device for measuring relative displacement between two members includes a scale grating and an optical encoder readhead comprising a first wavelength light source illuminating the grating. The grating outputs scale light to form a moving periodic intensity pattern at the first wavelength. The readhead comprises a plurality of spatial phase detectors comprising: a periodic spatial filter; a phosphor layer that receives light arising from the first wavelength periodic intensity pattern and outputs second wavelength light, and a photodetector element that receives, and is sensitive to, the second wavelength light. The photodetector element inputs second wavelength light corresponding to a spatially filtered version of the first wavelength periodic intensity pattern and outputs a signal indicative of its spatial phase relative to that spatial phase detector. The spatial filtering may be provided by a mask element, or by a pattern of the phosphor layer and/or the detector element, in various embodiments.