The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jan. 31, 2012
Applicants:

Nicholas Licausi, Watervilet, NY (US);

Jeremy Wahl, Delmar, NY (US);

Inventors:

Nicholas LiCausi, Watervilet, NY (US);

Jeremy Wahl, Delmar, NY (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein are various methods for better height control of the finFET patterned fins. In one example, this invention begins by depositing or growing an oxide material, for example, silicon dioxide. This oxide material is then patterned and etched to open windows or trenches to the substrate where fins will be grown. If a common channel material is desired, it is epitaxially grown in the windows. Then, some windows are covered and one pole of fins (for example nFET) are epitaxially grown in the exposed windows. The previously masked windows are opened and the newly formed fins are masked. The alternate channel material is then grown. The masked fins are then un-masked and the oxide is recessed to allow the fins to protrude from the oxide. This invention also allows for different channel materials for NMOS and PMOS.


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