The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Jul. 22, 2010
Jeroen Poeze, Mission Viejo, CA (US);
Jesse Chen, Lake Forest, CA (US);
Mathew Paul, Irvine, CA (US);
Marcelo Lamego, Coto De Caza, CA (US);
Massi Joe E. Kiani, Laguna Niguel, CA (US);
Jeroen Poeze, Mission Viejo, CA (US);
Jesse Chen, Lake Forest, CA (US);
Mathew Paul, Irvine, CA (US);
Marcelo Lamego, Coto De Caza, CA (US);
Massi Joe E. Kiani, Laguna Niguel, CA (US);
Cercacor Laboratories, Inc., Irvine, CA (US);
Abstract
A system is disclosed for detecting and calculating the level of ambient and/or environmental noise, such as electromagnetic interference generated by electric power lines, ambient lights, light dimmers, television or computer displays, power supplies or transformers, and medical equipment. In some embodiments, the system performs frequency analysis on the interference signal detected by light photodetectors and determines the power of the interference signal concentrated in the analyzed frequency bands. The worst-case interference level can be determined by selecting the maximum from the computed power values. In some embodiments, the determined interference signal power can be compared with the noise tolerance of a patient monitoring system configured to reliably and non-invasively detect physiological parameters of a user. The results of the comparison can be presented to the user audio-visually. In some embodiments, the system can be used to perform spot check measurements of electromagnetic interference.