The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Apr. 30, 2010
Dustin Fregeau, South Burlington, VT (US);
David L. Gardell, Fairfax, VT (US);
Laura L. Kosbar, Mohegan Lake, NY (US);
Keith C. Stevens, Fairfield, VT (US);
Grant W. Wagner, South Burlington, VT (US);
Dustin Fregeau, South Burlington, VT (US);
David L. Gardell, Fairfax, VT (US);
Laura L. Kosbar, Mohegan Lake, NY (US);
Keith C. Stevens, Fairfield, VT (US);
Grant W. Wagner, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methodologies and test configurations are provided for testing thermal interface materials and, in particular, methodologies and test configurations are provided for testing thermal interface materials used for testing integrated circuits. A test methodology includes applying a thermal interface material on a device under test. The test methodology further includes monitoring the device under test with a plurality of temperature sensors. The test methodology further includes determining whether any of the plurality of temperature sensors increases above a steady state.