The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Aug. 23, 2011
Applicants:

James A. Bailey, Snowflake, AZ (US);

Nayak Ratnakar Aravind, Allentown, PA (US);

Erich F. Haratsch, Bethlehem, PA (US);

Inventors:

James A. Bailey, Snowflake, AZ (US);

Nayak Ratnakar Aravind, Allentown, PA (US);

Erich F. Haratsch, Bethlehem, PA (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for processing a signal in a read channel using an oversampled analog to digital conversion. An oversampled analog to digital conversion is performed on an analog input signal to generate a plurality of digital samples corresponding to the analog input signal for a given bit interval. A data detection algorithm can then be applied on one or more of the digital samples to obtain a detected output. The oversampled analog to digital conversion simplifies the analog design by transferring at least a portion of the equalization and/or filtering processes to the digital domain.


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