The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Nov. 07, 2006
Applicants:

Michael William Phaneuf, Ottawa, CA;

Ken Guillaume Lagarec, Gatineau, CA;

Alexander Krechmer, Nepean, CA;

Inventors:

Michael William Phaneuf, Ottawa, CA;

Ken Guillaume Lagarec, Gatineau, CA;

Alexander Krechmer, Nepean, CA;

Assignee:

Fibics Incorporated, Ottawa, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/46 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for using sub-100V electron beam landing energies for performing circuit edit operations. Circuit edit operations can include imaging for navigation and etching in the presence of a suitable gas. Low landing energies can be obtained by modifying a decelerator system of native FESEM equipment, or by using biasing means near the sample surface for decelerating electrons of the primary beam. At low landing energies near the operating voltage of a semiconductor circuit, voltage contrast effects can be visually seen for enhancing operator navigation. Low landing energies can be used during etching processes for minimizing the interaction volume of the beam and obtaining accurate and localized etching.


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