The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Sep. 15, 2010
Applicants:

Paul G. Kostenick, Marysville, WA (US);

Dario I. Valenzuela, Snohomish, WA (US);

James Niemann Buttrick, Seattle, WA (US);

Arlen Ray Pumphrey, Lynnwood, WA (US);

Michael M. Stepan, Langley, WA (US);

Inventors:

Paul G. Kostenick, Marysville, WA (US);

Dario I. Valenzuela, Snohomish, WA (US);

James Niemann Buttrick, Seattle, WA (US);

Arlen Ray Pumphrey, Lynnwood, WA (US);

Michael M. Stepan, Langley, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/13 (2006.01); G01B 21/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for measuring diameters of holes and countersinks. A tip of a countersink measurement system may be moved to engage a countersink for a hole. A diameter of the countersink may be measured in response to the tip of the countersink measurement system engaging the countersink. A probe may be moved through the tip of the countersink measurement system into a channel for the hole, while the tip is engaged with the countersink. A number of diameters for the channel may be measured as the probe moves in the hole.


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