The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Mar. 25, 2011
Sandeep Jain, Rewari, IN;
Nikila Krishnamoorthy, Chennai, IN;
Abhishek Chaudhary, Nagpur, IN;
Nipun Mahajan, New Delhi, IN;
Saurabh Chauhan, Inder Puri, IN;
Sandeep Jain, Rewari, IN;
Nikila Krishnamoorthy, Chennai, IN;
Abhishek Chaudhary, Nagpur, IN;
Nipun Mahajan, New Delhi, IN;
Saurabh Chauhan, Inder Puri, IN;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.