The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Jul. 30, 2010
Derek Dang, San Jose, CA (US);
Alex Lafaive, Sunnyvale, CA (US);
Joe Scarpelli, Mountainview, CA (US);
Sridhar Sodem, Cupertino, CA (US);
Derek Dang, San Jose, CA (US);
Alex Lafaive, Sunnyvale, CA (US);
Joe Scarpelli, Mountainview, CA (US);
Sridhar Sodem, Cupertino, CA (US);
BMC Software, Inc., Houston, TX (US);
Abstract
An improved performance management technique allows automatic determination dynamic thresholds of a metric based on a baseline of the matching pattern. A pattern matching process is conducted against a set of baseline patterns to find the matching pattern. If a matching pattern is found, the baseline of the matching pattern is used as the dynamic threshold. A series of sanity checks are performed to reduce any false alarms. If the metric does not follow any pattern, a composite of baselines is selected as the dynamic threshold.