The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Feb. 19, 2010
Applicants:
Qingfeng Huang, San Jose, CA (US);
Ying Zhang, Cupertino, CA (US);
Inventors:
Qingfeng Huang, San Jose, CA (US);
Ying Zhang, Cupertino, CA (US);
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 22/00 (2006.01); G05D 1/00 (2006.01); G05D 2/00 (2006.01); G05D 3/00 (2006.01); G05D 4/00 (2006.01); G05D 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for determining characteristics of a physical environment with simple motion patterns are provided. A plurality of raw orientation readings are received from a simple motion pattern. A distribution of possible wall orientations upon each raw reading is determined. Wall direction is determined as the mean value of the distribution.
Huang, Qingfeng. (2013). System and method for determining characteristics of a physical environment with simple motion patterns (U.S. Patent No. 8457829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8457829
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile