The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Jan. 19, 2011
Applicants:

Jae-joon Kim, Old Tappan, NJ (US);

Rahul M. Rao, Austin, TX (US);

Inventors:

Jae-Joon Kim, Old Tappan, NJ (US);

Rahul M. Rao, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 3/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A ring oscillator circuit for measurement of negative bias temperature instability effect and/or positive bias temperature instability effect includes a ring oscillator having first and second rails, and an odd number (at least 3) of repeating circuit structures. Each of the repeating circuit structures in turn includes an input terminal and an output terminal; a first p-type transistor having a gate, a first drain-source terminal coupled to the first rail, and a second drain source terminal selectively coupled to the output terminal; a first n-type transistor having a gate, a first drain-source terminal coupled to the second rail, and a second drain source terminal selectively coupled to the output terminal; and repeating-circuit-structure control circuitry. The ring oscillator circuit also includes a voltage supply and control block.


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